Speaker: Dr. Hanfei Yan, beamline scientist, National Synchrotron Light Source II

Title: Nanoscale scanning x-ray microscopy: a versatile tool for material characterization in 2D and 3D

Date of Recording: Thursday May 16, 2024

Venue: Upcoming New Soft X-ray Nanoscale Imaging and Spectromicroscopy Capabilities at NSLS-II. NSLS-II Users’ Meeting, Brookhaven National Laboratory, Upton, NY, USA, May 16-17, 2024 (workshop).

Convenors:

Wen Hu, National Synchrotron Light Source II
Brandy Toner, University of Minnesota, toner@umn.edu
Andrew Walter, National Synchrotron Light Source II
Joe Dvorak, National Synchrotron Light Source II
Jiemin Li, National Synchrotron Light Source II

Workshop Citation: Hu, W., Toner, B.M., Walter, A., Dvorak, J. Li, J. (2024). Upcoming New Soft X-ray Nanoscale Imaging and Spectromicroscopy Capabilities at NSLS-II. NSLS-II Users’ Meeting, Brookhaven National Laboratory, Upton, NY, USA, May 16-17, 2024 (workshop).